DocumentCode
503091
Title
Process characterisation of DuPont MXA140 dry film for high resolution microbump application
Author
Liebsch, W. ; Hao Yun ; Balut, C.E. ; Ahr, A. ; Phung, A. ; Huffman, Alan
Author_Institution
DuPont Electron. Technol., DuPont de Nemours s.a.r.l., Contern, Luxembourg
fYear
2009
fDate
15-18 June 2009
Firstpage
1
Lastpage
4
Abstract
The dry film has shown improved thickness uniformity and cost competitiveness versus liquid photoresists. However, traditional dry film photoresists for high pillar bump plating show limited resolution capabilities. DuPont has developed the MXAdvance100 series dry film photoresist for high resolution applications for high density wafer level packages. It offers unique characteristics like the smooth side wall, high aspect ratio and high resolution. It is an ideal photoresist material for sharply defined metal plating on wafer. The paper describes how to achieve the high resolution and how process conditions impact on the resolution and material performance including the micro pillar plating. The detailed process evaluation includes the entire lithographic process including the remove process. Cross section SEM analysis, process window and process linearity were studied for copper micro pillar fabrication. The key factors were identified for achieving a good high density micro pillar structure.
Keywords
lithography; photoresists; scanning electron microscopy; thin films; DuPont MXA140 dry film; copper micropillar fabrication; cross section SEM analysis; dry film photoresists; high resolution microbump application; lithographic process; material performance; micropillar plating; Adhesives; Consumer electronics; Costs; Electronics packaging; Lamination; Protection; Resists; Shape; Temperature; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and Packaging Conference, 2009. EMPC 2009. European
Conference_Location
Rimini
Print_ISBN
978-1-4244-4722-0
Electronic_ISBN
978-0-6152-9868-9
Type
conf
Filename
5272852
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