DocumentCode
504678
Title
Performance evaluation of WC-C peritectic high-temperature fixed point
Author
Sasajima, Naohiko ; Yamada, Yoshiro
Author_Institution
Radiat. Thermometry Sect., AIST, Tsukuba, Japan
fYear
2009
fDate
18-21 Aug. 2009
Firstpage
3307
Lastpage
3310
Abstract
WC-C peritectic fixed point (2749degC) was investigated to evaluate their potential of serving as high-temperature reference points in thermometry. Four WC-C peritectic cells were constructed and the melting and freezing plateaus were evaluated by means of radiation thermometer. The repeatability of the melting temperature of one cell was 0.011 K with the melting range of 0.117 K. The melting temperatures of four different cells were agreed within 0.05 K. The long term stability of WC-C cell was also evaluated by the realization of 45 melt/freeze cycles. The standard deviation of 45 melting temperatures was 0.034 K including the instability of LP3. From these results, it can be concluded that WC-C peritectic fixed point has a high potential to be used as a high temperature reference point. The microstructure analyses of WC-C peritectic cells by means of optical microscopy and electron-probe microanalysis (EPMA) showed the segregation of the graphite in the WC-C cell.
Keywords
electron probe analysis; freezing; melting point; optical microscopy; performance evaluation; thermometers; tungsten compounds; WC-C peritectic cells; electron-probe microanalysis; graphite segregation; high-temperature reference point; melt-freeze cycle; melting temperature; microstructure analyses; optical microscopy; performance evaluation; peritectic high-temperature fixed point; radiation thermometer; temperature 0.011 K; temperature 0.05 K; temperature 0.117 K; temperature 2749 degC; thermometry; Calibration; Electron microscopy; Filling; Metrology; Microstructure; Optical microscopy; Powders; Temperature distribution; Temperature sensors; Uncertainty; WC-C; fixed point; high temperature; peritectic; radiation thermometer; temperature standard;
fLanguage
English
Publisher
ieee
Conference_Titel
ICCAS-SICE, 2009
Conference_Location
Fukuoka
Print_ISBN
978-4-907764-34-0
Electronic_ISBN
978-4-907764-33-3
Type
conf
Filename
5334353
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