DocumentCode
505502
Title
A new methodology for early stage thermal analysis of complex electronic systems
Author
Martins, O. ; Peltier, N. ; Guédon, S. ; Kaiser, S. ; Marechal, Y. ; Avenas, Y.
Author_Institution
G2ELAB, INPG-UJF-CNRS, St. Martin d´´Heres, France
fYear
2009
fDate
7-9 Oct. 2009
Firstpage
17
Lastpage
22
Abstract
This paper presents a new methodology called Flex-CTM for Flexible Compact Thermal Modeling to build and to interface compact thermal models at different modeling levels. Each part of an electronic system is prepared to be Bou ndary Condition independent (BCI) such as to be plugged to other parts. Each part model is reduced to save memory and time consuming at the simulation stage. The resulting pluggable and reduced thermal model is called a micro-model. Therefore, a fast-to-simulate macro-model of a full microelectronic system can be obtained by assembling micro-models. The Flex-CTM is found to have numerous advantages over both current resistive models (junction-to-case and junction-to-board) and Dynamic Compact Thermal Models. The first advantage of the methodology is that multi-source and dynamic simulations of an electronic system can be performed at any design level. The second one is the control of the accuracy. The third advantage is the Boundary Condition Independence property that allows architecture exploration. Finally and the most important, micro and macro-models can be shared by teams to be reused and completed.
Keywords
boundary-elements methods; power electronics; thermal analysis; Flex-CTM; boundary condition independent; complex electronic systems; dynamic compact thermal models; early stage thermal analysis; flexible compact thermal modeling; Assembly; Boundary conditions; Electronic components; Electronic packaging thermal management; Microelectronics; Numerical models; Performance evaluation; Power system modeling; Temperature; Thermal resistance; Boundary Condition Independence; Compact Thermal Modeling; model coupling; multi-level modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
Conference_Location
Leuven
Print_ISBN
978-1-4244-5881-3
Type
conf
Filename
5340079
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