DocumentCode
505528
Title
Using VFTLP data to design for CDM robustness
Author
Chu, Charles ; Gallerano, Antonio ; Watt, Jeff ; Hoang, Tim ; Tran, Tina ; Chan, Doris ; Wong, Wilson ; Barth, Jon ; Johnson, Martin
Author_Institution
Altera Corp., San Jose, CA, USA
fYear
2009
fDate
Aug. 30 2009-Sept. 4 2009
Firstpage
1
Lastpage
6
Abstract
In this paper, transient behavior of DTSCRs is captured and analyzed using high speed measurement with VFTLP. It is possible to use this data to properly design for CDM performance of final product while maximizing performance.
Keywords
diodes; electrostatic discharge; failure analysis; high-speed techniques; thyristors; transients; transmission lines; CDM robustness; DTSCRs; Si; VFTLP data; diode triggered SCR; failure analysis; high-speed measurement; maximizing performance; silicon controlled rectifier; transient behavior; very-fast transmission line pulse; Circuit testing; Clamps; Electrostatic discharge; Fault location; Oscilloscopes; Packaging; Protection; Robustness; Vehicles; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
EOS/ESD Symposium, 2009 31st
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-176-1
Electronic_ISBN
978-1-58537-176-1
Type
conf
Filename
5340115
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