• DocumentCode
    506637
  • Title

    Model accuracy for hierarchical problems

  • Author

    Karshenas, Hossein ; Nikanjam, Amin ; Helmi, B. Hoda ; Rahmani, Adel T.

  • Author_Institution
    Dept. of Comput. Eng., Iran Univ. of Sci. & Technol. (IUST), Tehran, Iran
  • Volume
    1
  • fYear
    2009
  • fDate
    20-22 Nov. 2009
  • Firstpage
    852
  • Lastpage
    856
  • Abstract
    Estimation of distribution algorithms, especially those using Bayesian network as their probabilistic model, have been able to solve many challenging optimization problems, including the class of hierarchical problems, competently. Since model-building constitute an important part of these algorithms, finding ways to improve the quality of the models built during optimization is very beneficial. This in turn requires mechanisms to evaluate the quality of the models, as each problem has a large space of possible models. The efforts in this field are mainly concentrated on single-level problems, due to complex structure of hierarchical problems which makes them hard to treat. In order to extend model analysis to hierarchical problems, a model evaluation algorithm is proposed in this paper which can be applied to different problems. The results of applying the algorithm to two common hierarchical problems are also mentioned and described.
  • Keywords
    Bayes methods; belief networks; distributed algorithms; optimisation; Bayesian network; distribution algorithm; hierarchical problems; model accuracy; model analysis; model evaluation algorithm; optimization problem; probabilistic model; Algorithm design and analysis; Bayesian methods; Computational complexity; Computational modeling; Couplings; Electronic design automation and methodology; Genetic algorithms; Laboratories; Sampling methods; Scalability; EDAs; evaluation metries; hierarchical problems; model accuracy; template matrix;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-4754-1
  • Electronic_ISBN
    978-1-4244-4738-1
  • Type

    conf

  • DOI
    10.1109/ICICISYS.2009.5358041
  • Filename
    5358041