• DocumentCode
    51027
  • Title

    Degradation Data Analysis Using Wiener Processes With Measurement Errors

  • Author

    Zhi-Sheng Ye ; Yu Wang ; Kwok-Leung Tsui ; Pecht, Michael

  • Author_Institution
    Dept. of Syst. Eng. & Eng. Manage., City Univ. of Hong Kong, Hong Kong, China
  • Volume
    62
  • Issue
    4
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    772
  • Lastpage
    780
  • Abstract
    Degradation signals that reflect a system´s health state are important for diagnostics and health management of complex systems. However, degradation signals are often compounded and contaminated by measurement errors, making data analysis a difficult task. Motivated by the wear problem of magnetic heads used in hard disk drives (HDDs), this paper investigates Wiener processes with measurement errors. We explore the traditional Wiener process with positive drifts compounded with i.i.d. Gaussian noises, and improve its estimation efficiency compared with the existing inference procedure. Furthermore, to capture the possible heterogeneity in a population, we develop a mixed effects model with measurement errors. Statistical inferences of this model are discussed. The mixed effects model subsumes several existing Wiener processes as its limiting cases, and thus it is useful for suggesting an appropriate Wiener process model for a specific dataset. The developed methodologies are then applied to the wear problem of magnetic heads of HDDs, and a light intensity degradation problem of light-emitting diodes.
  • Keywords
    data analysis; disc drives; light emitting diodes; magnetic heads; measurement errors; stochastic processes; Wiener processes; degradation data analysis; hard disk drives; health state; light-emitting diodes; magnetic heads; measurement errors; statistical inferences; Analytical models; Data analysis; Data models; Degradation; Magnetic heads; Maximum likelihood estimation; Measurement errors; Embedded model; random effects; wear data;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2013.2284733
  • Filename
    6632957