DocumentCode
511724
Title
An Heuristic Genetic Algorithm Solve Test Point Selecting with Unreliable Test
Author
Pan, Jia-Liang ; Ye, Xiao-Hui ; Xue, Qiang
Author_Institution
Dept. of Electron. Eng., Naval Univ. of Eng., Wuhan, China
Volume
1
fYear
2009
fDate
28-30 Oct. 2009
Firstpage
227
Lastpage
232
Abstract
A mathematical model of the test selection with unreliable test is created and a heuristic function of the test point are established based on the tolerances of the test point detection, coverage and reliance in this paper. In order to overcome the computational explosion, the genetic algorithm with heuristic function is proposed to settle the test selection problem with unreliable test. The algorithm is illustrated and tested using a range of a real-word system. The examples show that this algorithm is significantly better than simple genetic algorithm. It is also feasible and effective, especially in the large-scale system.
Keywords
genetic algorithms; program testing; computational explosion; heuristic function; heuristic genetic algorithm solve test point selecting; large-scale system; mathematical model; real-word system; test point detection; test selection; unreliable test; Algorithm design and analysis; Costs; Electronic equipment testing; Explosions; Fault diagnosis; Finite impulse response filter; Genetic algorithms; Genetic engineering; Greedy algorithms; System testing; genetic algorithm; heuristic function; test point selecting; testability analysis; unreliable test;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Engineering, 2009. WCSE '09. Second International Workshop on
Conference_Location
Qingdao
Print_ISBN
978-0-7695-3881-5
Type
conf
DOI
10.1109/WCSE.2009.659
Filename
5403476
Link To Document