• DocumentCode
    511724
  • Title

    An Heuristic Genetic Algorithm Solve Test Point Selecting with Unreliable Test

  • Author

    Pan, Jia-Liang ; Ye, Xiao-Hui ; Xue, Qiang

  • Author_Institution
    Dept. of Electron. Eng., Naval Univ. of Eng., Wuhan, China
  • Volume
    1
  • fYear
    2009
  • fDate
    28-30 Oct. 2009
  • Firstpage
    227
  • Lastpage
    232
  • Abstract
    A mathematical model of the test selection with unreliable test is created and a heuristic function of the test point are established based on the tolerances of the test point detection, coverage and reliance in this paper. In order to overcome the computational explosion, the genetic algorithm with heuristic function is proposed to settle the test selection problem with unreliable test. The algorithm is illustrated and tested using a range of a real-word system. The examples show that this algorithm is significantly better than simple genetic algorithm. It is also feasible and effective, especially in the large-scale system.
  • Keywords
    genetic algorithms; program testing; computational explosion; heuristic function; heuristic genetic algorithm solve test point selecting; large-scale system; mathematical model; real-word system; test point detection; test selection; unreliable test; Algorithm design and analysis; Costs; Electronic equipment testing; Explosions; Fault diagnosis; Finite impulse response filter; Genetic algorithms; Genetic engineering; Greedy algorithms; System testing; genetic algorithm; heuristic function; test point selecting; testability analysis; unreliable test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Engineering, 2009. WCSE '09. Second International Workshop on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-0-7695-3881-5
  • Type

    conf

  • DOI
    10.1109/WCSE.2009.659
  • Filename
    5403476