A 0.18 µm CMOS multi-Gb/s 10-PAM transmitter

Author

Jeong, Jikyung ; Lee, Jeongjun ; Burm, Jinwook

Author_Institution

Dept. of Electron. Eng., Sogang Univ., Seoul, South Korea

fYear

2009

fDate

14-16 Dec. 2009

Firstpage

85

Lastpage

88

Abstract

A multi-Gb/s transmitter using multi-level pulse amplitude modulation (M-PAM) is presented. 10-PAM enables transmitter to decrease the symbol rate compared to binary signaling. The transmitter transmits data in current-mode instead of voltage mode, so that high switching speed of driver is achieved. Besides core blocks of the transmitter, Pseudo random bit sequence (PRBS) generator was designed for built-in self-test (BIST). The 10-PAM transmitter is designed in 0.18 μm CMOS process and achieves 3.2 Gb/s with 1.8 V supply voltage.

Keywords

CMOS logic circuits; built-in self test; integrated circuit testing; pulse amplitude modulation; random sequences; transmitters; CMOS 10-PAM transmitter; binary signaling; bit built-in self-test; bit rate 3.2 Gbit/s; current mode; driver switching speed; multi-level pulse amplitude modulation; pseudo random bit sequence generator; size 0.18 μm; symbol rate; voltage 1.8 V; Amplitude modulation; Automatic testing; Bit rate; Built-in self-test; Frequency; Multiplexing; Pulse modulation; Transceivers; Transmitters; Voltage; 10-PAM; CMOS; current mode; transmitter;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on

Conference_Location

Singapore

Print_ISBN

978-9-8108-2468-6

Type

conf

Filename

5403720