• DocumentCode
    512684
  • Title

    Power Dissipation in SWCNT-interconnect

  • Author

    Rai, Mayank Kumar ; Spandana, G. ; Nivedita ; Sarkar, S.

  • Author_Institution
    Dept. of Electron. & Comm. Eng., Thapar Univ., Patiala, India
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper addresses power dissipation in single walled carbon nanotube bundle interconnect for VLSI applications at 22 nm technology node. SPICE simulation shows that due to high capacitance, SWCNT-bundle interconnect is of higher power dissipation than copper interconnect. Power dissipation decreases with increase in tube diameter of the constituent SWCNTs. CNT interconnect resistance and inductance increases with increase in diameter and length. On the other hand, with increase in tube diameter interconnect capacitance decreases. However, increase in interconnect length increases the capacitance. Our analysis shows that choice of tube diameter is critical for good power management.
  • Keywords
    SPICE; VLSI; carbon nanotubes; equivalent circuits; interconnections; nanotechnology; C; SPICE simulation; SWCNT-interconnect; VLSI applications; interconnect inductance; interconnect resistance; power dissipation; single walled carbon nanotube; size 22 nm; Carbon nanotubes; Contact resistance; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Power dissipation; Quantum capacitance; Radio frequency; SPICE; Carbon nanotube (CNT); Single walled carbon nanotube(SWCNT); simulation program with integrated circuit emphasis (SPICE);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computers and Devices for Communication, 2009. CODEC 2009. 4th International Conference on
  • Conference_Location
    Kolkata
  • Print_ISBN
    978-1-4244-5073-2
  • Type

    conf

  • Filename
    5407251