DocumentCode
512684
Title
Power Dissipation in SWCNT-interconnect
Author
Rai, Mayank Kumar ; Spandana, G. ; Nivedita ; Sarkar, S.
Author_Institution
Dept. of Electron. & Comm. Eng., Thapar Univ., Patiala, India
fYear
2009
fDate
14-16 Dec. 2009
Firstpage
1
Lastpage
4
Abstract
This paper addresses power dissipation in single walled carbon nanotube bundle interconnect for VLSI applications at 22 nm technology node. SPICE simulation shows that due to high capacitance, SWCNT-bundle interconnect is of higher power dissipation than copper interconnect. Power dissipation decreases with increase in tube diameter of the constituent SWCNTs. CNT interconnect resistance and inductance increases with increase in diameter and length. On the other hand, with increase in tube diameter interconnect capacitance decreases. However, increase in interconnect length increases the capacitance. Our analysis shows that choice of tube diameter is critical for good power management.
Keywords
SPICE; VLSI; carbon nanotubes; equivalent circuits; interconnections; nanotechnology; C; SPICE simulation; SWCNT-interconnect; VLSI applications; interconnect inductance; interconnect resistance; power dissipation; single walled carbon nanotube; size 22 nm; Carbon nanotubes; Contact resistance; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Power dissipation; Quantum capacitance; Radio frequency; SPICE; Carbon nanotube (CNT); Single walled carbon nanotube(SWCNT); simulation program with integrated circuit emphasis (SPICE);
fLanguage
English
Publisher
ieee
Conference_Titel
Computers and Devices for Communication, 2009. CODEC 2009. 4th International Conference on
Conference_Location
Kolkata
Print_ISBN
978-1-4244-5073-2
Type
conf
Filename
5407251
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