DocumentCode
514007
Title
Reduction of Titanium Silicide Degradation During Borophosphosilicate Glass Reflow
Author
Burmester, R. ; Joswig, H. ; Mitwalsky, A.
Author_Institution
Siemens AG, Corporate, Research and Development, Otto-Hahn-Ring 6, D-8000 Mÿnchen 83, F.R.G
fYear
1989
fDate
11-14 Sept. 1989
Firstpage
233
Lastpage
236
Abstract
The application of a self-aligned silicide (``salicide´´) process with Ti requires reduction of following excessive heat-treatment [1]. E.g. a commonly used borophosphosilicate glass (BPSG) reflow process (900 °C, 40 min, N2 has been found to cause severe morphological degradation of the TiSi2 layer [2] resulting in higher sheet resistance (RS ). On the other hand the use of BPSG is advantageous because of its planarization capabilities and its gettering function of mobile alkali ions [3]. In this contribution the degradation mechanism and the influence of process parameters are investigated. As a result a Ti salicide process was established which was able to withstand following isolation oxide processes with temperatures of 900° C.
Keywords
Degradation; Glass; Optical microscopy; Silicides; Silicon; Sputter etching; Surface finishing; Surface treatment; Titanium; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location
Berlin, Germany
Print_ISBN
0387510001
Type
conf
Filename
5436624
Link To Document