• DocumentCode
    514007
  • Title

    Reduction of Titanium Silicide Degradation During Borophosphosilicate Glass Reflow

  • Author

    Burmester, R. ; Joswig, H. ; Mitwalsky, A.

  • Author_Institution
    Siemens AG, Corporate, Research and Development, Otto-Hahn-Ring 6, D-8000 Mÿnchen 83, F.R.G
  • fYear
    1989
  • fDate
    11-14 Sept. 1989
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    The application of a self-aligned silicide (``salicide´´) process with Ti requires reduction of following excessive heat-treatment [1]. E.g. a commonly used borophosphosilicate glass (BPSG) reflow process (900 °C, 40 min, N2 has been found to cause severe morphological degradation of the TiSi2 layer [2] resulting in higher sheet resistance (RS). On the other hand the use of BPSG is advantageous because of its planarization capabilities and its gettering function of mobile alkali ions [3]. In this contribution the degradation mechanism and the influence of process parameters are investigated. As a result a Ti salicide process was established which was able to withstand following isolation oxide processes with temperatures of 900° C.
  • Keywords
    Degradation; Glass; Optical microscopy; Silicides; Silicon; Sputter etching; Surface finishing; Surface treatment; Titanium; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
  • Conference_Location
    Berlin, Germany
  • Print_ISBN
    0387510001
  • Type

    conf

  • Filename
    5436624