DocumentCode
514090
Title
BI(C)MOS Dream or Nightmare?
Author
Hart, P.A.H.
Author_Institution
Philips Research Laboratories, P.O. BOX 80.000, 5600 JA Eindhoven, The Netherlands
fYear
1987
fDate
14-17 Sept. 1987
Firstpage
1
Lastpage
8
Abstract
The paper presents a summary of advantages of mixed bipolar-CMOS processes for analog and digital VLSI and some design considerations.
Keywords
Avalanche breakdown; Bismuth; Breakdown voltage; CMOS logic circuits; Capacitors; Integrated circuit technology; Low voltage; Switches; Very large scale integration; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location
Bologna, Italy
Print_ISBN
0444704779
Type
conf
Filename
5436738
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