DocumentCode
516436
Title
Novel High Performance Complementary CAM/RAM Circuits
Author
Haraszti, T.P.
Author_Institution
Microcirc Associates, Newport Beach, California, U.S.A.
fYear
1985
fDate
16-18 Sept. 1985
Firstpage
237
Lastpage
240
Abstract
Novel complementary CAM/RAM circuits feature very short access time (3.4 nsec), high density (6 and 8 minimum size device/cell) and radiation hardness (1 à 106 rad (Si)) in a hierarchical organization of 4k bit memory modules. The design utilizes innovative static memory cells and operating scheme, optimized fault-tolerant modular architecture and 1.25-2¿m advanced CMOS VLSI process.
Keywords
CADCAM; Circuits; Computer aided manufacturing; Fault tolerance; Random access memory; Read-write memory; Temperature sensors; Threshold voltage; Very large scale integration; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1985. ESSCIRC '85. 11th European
Conference_Location
Toulouse, France
Type
conf
Filename
5468089
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