• DocumentCode
    516472
  • Title

    Voltage Reduction for 4Mbit-CMOS-DRAM

  • Author

    Eichfeld, H. ; Rieger, J. ; Harter, Jonathan

  • Author_Institution
    Siemens AG, Corporate Research and Development, Otto Hahn Ring 6, D-8000 Munich 83, FRG; Lehrstuhl f?r Technische Elektronik, Universit?t Erlangen, Kauerstr. 9, D-8520 Erlangen, FRG
  • fYear
    1986
  • fDate
    16-18 Sept. 1986
  • Firstpage
    7
  • Lastpage
    9
  • Abstract
    Different types of voltage reduction circuits for application to VLSI-DRAMs have been investigated. A lumped element network description of the circuits and the distributed power supply of a 4Mbit chip has been developed to model the load characteristic of the memory in a realistic way. It is shown, that the peak currents in the active cycle can be delivered by the distributed capacities of the supply lines, thus the switching speed of the reduction circuit can be substantially less than the switching speed of the decoder or amplifier circuits.
  • Keywords
    Capacitance; Circuit simulation; Decoding; Load modeling; MOSFETs; Power supplies; Random access memory; Switching circuits; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
  • Conference_Location
    Delft, The Netherlands
  • Type

    conf

  • Filename
    5468238