• DocumentCode
    516571
  • Title

    Trends in Design for Testability

  • Author

    Williams, T.W.

  • Author_Institution
    IBM CORPORATION, GENERAL TECHNICAL DIVISION, BOULDER, COLORADO, U.S.A.
  • fYear
    1986
  • fDate
    16-18 Sept. 1986
  • Firstpage
    146
  • Lastpage
    148
  • Abstract
    This paper will present the currently used techniques in the area of Design for Testability. It will begin with the Ad Hoc approaches of In-Circuit techniques, Functional Testing and Signature Analysis. Then the Structured Approaches of Scan Design will be discussed. Finally the techniques of Self-Testing will be discussed such as BILBO, and Exhaustive Testing. With each of these areas, the trends in usage will be indicated.
  • Keywords
    Automatic testing; Built-in self-test; Cost function; Design for testability; Equations; Logic design; Logic testing; Microprocessors; System testing; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
  • Conference_Location
    Delft, The Netherlands
  • Type

    conf

  • Filename
    5468360
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516571