• DocumentCode
    516618
  • Title

    3D Double-Lambda-Diode VLSI SRAM Cells

  • Author

    McGonigal, Gordon C. ; Elmasry, Mohamed I.

  • Author_Institution
    Department of Electrical Engineering, University of Waterloo, Waterloo, Ontario, Canada, N2L 3G1
  • fYear
    1988
  • fDate
    21-23 Sept. 1988
  • Firstpage
    86
  • Lastpage
    90
  • Abstract
    A three-dimensional (3D) implementation of the double-lambda-diode SRAM cell is proposed. It is shown that this cell provides greater noise immunity, but requires approximately the same area, as the conventional resistive-load cell.
  • Keywords
    CMOS technology; Circuit noise; Driver circuits; Dynamic voltage scaling; Integrated circuit interconnections; MOS devices; Random access memory; Stacking; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
  • Conference_Location
    Manchester, UK
  • Type

    conf

  • Filename
    5468425