DocumentCode
517055
Title
Objectives for Integrated Circuit Tolerance Design
Author
Adby, P.R.
Author_Institution
Univ. of London King´´s Coll., London, UK
fYear
1976
fDate
21-24 Sept. 1976
Firstpage
48
Lastpage
49
Abstract
The objectives of statistical tolerance design are established in relation to the practical design situation for large integrated circuits.
Keywords
fault tolerance; integrated circuit design; integrated circuit tolerance design; large integrated circuit; statistical tolerance design; Circuit analysis computing; Educational institutions; Equations; Filters; Integrated circuit measurements; Integrated circuit yield; Moment methods; Sampling methods; Tolerance analysis; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
Conference_Location
Toulouse
Type
conf
Filename
5469098
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