DocumentCode
519890
Title
Methods and schemes of measuring the electric circuit resistance parameter value
Author
Pukach, Andriy ; Ivantsiv, Roman-Andriy ; Teslyuk, Vasyl
Author_Institution
CAM Dept., Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2010
fDate
20-23 April 2010
Firstpage
131
Lastpage
134
Abstract
A short analysis of the existing methods and schemes of measuring the unknown value of the electric circuit resistance parameter is conducted in present article. Their principle advantages and disadvantages are specified from the point of view of their prospective improvement aimed at solution of the problem of electric resistance measuring accuracy in MEMS technologies.
Keywords
electric resistance measurement; micromechanical devices; MEMS technologies; electric circuit resistance parameter value measurement; Bridge circuits; Electric resistance; Electric variables measurement; Electrical resistance measurement; Immune system; Micromechanical devices; Strain measurement; Surface resistance; Voltage measurement; Voltmeters; MEMS; electric resistance; ohmmeter; resistance parameter;
fLanguage
English
Publisher
ieee
Conference_Titel
Perspective Technologies and Methods in MEMS Design (MEMSTECH), 2010 Proceedings of VIth International Conference on
Conference_Location
Lviv
Print_ISBN
978-1-4244-7325-0
Electronic_ISBN
978-966-2191-11-0
Type
conf
Filename
5499305
Link To Document