DocumentCode
520385
Title
Performance of serial time-encoded amplified microscopy
Author
Tsia, Kevin K. ; Goda, Keisuke ; Capewell, Dale ; Jalali, Bahram
Author_Institution
Deparment of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear
2010
fDate
16-21 May 2010
Firstpage
1
Lastpage
2
Abstract
Serial time-encoded amplified microscopy (STEAM) is a new high-sensitivity ultrafast real-time imaging modality. Here we describe an analysis of its spatial resolution, frame rate, and detection sensitivity.
Keywords
Biomedical optical imaging; Charge coupled devices; Electron microscopy; High speed optical techniques; Optical imaging; Optical microscopy; Optical sensors; Spatial resolution; Stimulated emission; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
978-1-55752-890-2
Electronic_ISBN
978-1-55752-890-2
Type
conf
Filename
5499956
Link To Document