• DocumentCode
    520680
  • Title

    Ultrastable atomic force microscopy using laser-based, active noise cancelation

  • Author

    Perkins, Thomas T. ; King, Gavin M. ; Churnside, Allison B. ; Carter, Ashley R.

  • fYear
    2010
  • fDate
    16-21 May 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We achieved a 100-fold improvement in tip-sample stability by stabilizing the tip and the sample in 3D using laser light back-scattered off the apex of an AFM tip and a reference mark in the sample.
  • Keywords
    Active noise reduction; Atom lasers; Atom optics; Atomic beams; Atomic force microscopy; Atomic measurements; Laser noise; Laser stability; Noise cancellation; Optical microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS), 2010 Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    978-1-55752-890-2
  • Electronic_ISBN
    978-1-55752-890-2
  • Type

    conf

  • Filename
    5500272
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=520680