• DocumentCode
    525663
  • Title

    OPLS and COPLS: Two new PLS modeling approaches

  • Author

    Sun, Quansen ; Hou, Shudong ; Xia, Deshen

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Nanjing Univ. of Sci. & Technol., Nanjing, China
  • fYear
    2010
  • fDate
    23-25 June 2010
  • Firstpage
    456
  • Lastpage
    460
  • Abstract
    The partial least squares (PLS) regression is a novel multivariate data analysis method developed from practical applications in real word. In this paper, we first present two new PLS modeling methods (OPLS and COPLS) according to different constraints, and then discuss the two methods theoretically. Based on the idea of PLS model, a new face recognition approach is proposed. The process can be explained as follows: extract two sets of feature vectors from the same pattern, and establish PLS criterion function between the two sets of feature vectors; extract two sets of PLS component (feature vectors) of the pattern by the proposed algorithm, and constitute correlation double-subspace; finally, a serial classifier on the correlation double-subspace is designed, and used in pattern classification. Experimental results on the Yale face image database show that the face recognition approach in this paper is effective.
  • Keywords
    data analysis; face recognition; feature extraction; image classification; iterative methods; least mean squares methods; pattern classification; regression analysis; vectors; COPLS; correlation double-subspace; face recognition; feature vectors; multivariate data analysis; partial least squares regression; pattern classification; serial classifier; Application software; Computer science; Covariance matrix; Data analysis; Data mining; Face recognition; Feature extraction; Least squares methods; Principal component analysis; Sun; conjugate orthogonal; face recognition; feature extraction; orthogonal; partial least squares;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering and Data Mining (SEDM), 2010 2nd International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-7324-3
  • Electronic_ISBN
    978-89-88678-22-0
  • Type

    conf

  • Filename
    5542877