• DocumentCode
    525859
  • Title

    Normally-off AlGaN/GaN HFET with p-type Ga Gate and AlGaN buffer

  • Author

    Hilt, O. ; Knauer, A. ; Brunner, F. ; Bahat-Treidel, E. ; Würfl, J.

  • Author_Institution
    Ferdinand-Braun-Inst., Leibniz Inst. fuer Hoechstfrequenztechnik, Berlin, Germany
  • fYear
    2010
  • fDate
    6-10 June 2010
  • Firstpage
    347
  • Lastpage
    350
  • Abstract
    A 1.5 A normally-off GaN transistor for power applications in p-type GaN gate technology with a modified epitaxial layer structure is presented. A higher threshold voltage is achieved while keeping the on-state resistance low by using an AlGaN buffer instead of a GaN buffer. Additionally, the AlGaN buffer acts as a back-barrier and suppresses source-drain punch-through currents in the off-state. P-GaN gate GaN transistors with AlGaN buffer will therefore yield higher breakdown voltages as compared to standard GaN buffer versions which results in an excellent VBr-to-RON ratio. The proposed normally-off technology shows save operation under elevated ambient temperature up to 200°C without thermal runaway. In contrast to standard Schottky-gate AlGaN/GaN HEMTs, a reverse diode operation is possible for off-state conditions which may enable improved inverter circuits.
  • Keywords
    Schottky gate field effect transistors; buffer circuits; electric breakdown; epitaxial layers; high electron mobility transistors; invertors; power transistors; AlGaN buffer; AlGaN-GaN; Schottky-gate AlGaN-GaN HEMT; breakdown voltages; current 1.5 A; improved inverter circuits; low on-state resistance; modified epitaxial layer structure; normal-off AlGaN-GaN HFET; p-GaN gate GaN transistors; p-type GaN gate buffer technology; reverse diode operation; source-drain punch-through current suppression; threshold voltage; Aluminum gallium nitride; Circuits; Epitaxial layers; Gallium nitride; HEMTs; Inverters; MODFETs; Schottky diodes; Temperature; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2010 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4244-7718-0
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • Filename
    5543864