• DocumentCode
    525878
  • Title

    Advanced RFC technology with new cathode structure of field limiting rings for High Voltage planar diode

  • Author

    Nakamura, Katsumi ; Masuoka, Fumihito ; Nishii, Akito ; Sadamatsu, Koji ; Kitajima, Soichi ; Hatade, Kazunari

  • Author_Institution
    Power Device Works, Mitsubishi Electr. Corp. Fukuoka, Fukuoka, Japan
  • fYear
    2010
  • fDate
    6-10 June 2010
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    The edge of the active area and termination structure have a decisive influence on the recovery safety operating area (SOA) of High Voltage (HV) freewheeling diodes (FWDs). We have investigated the HV planar anode diode that breaks the triangle trade-off limitations between the overall loss, the reverse recovery softness and the recovery SOA. Our results show the destruction phenomena during the recovery operation for HV diodes originate in the local heating caused by high electric field and high current density at the end of the active area. Therefore, a newly developed HV diode based on the Relaxed Field of Cathode (RFC) technology achieves high total performance by adopting a new cathode structure of the field limiting rings region. The new diode offers low overall loss combined with a high recovery SOA and superior snap-off capability. The proposed new diode structure demonstrates a clear triangle trade-off breakthrough between the overall loss, the reverse softness and the recovery SOA of the HV diode.
  • Keywords
    cathodes; current density; electric fields; low-power electronics; semiconductor diodes; HV planar anode diode; RFC technology; active area; cathode structure; current density; electric field; field limiting rings; freewheeling diodes; high voltage planar diode; recovery SOA; recovery softness; relaxed field of cathode; safety operating area; termination structure; Analytical models; Anodes; Cathodes; Current density; Insulated gate bipolar transistors; Performance loss; Power semiconductor devices; Semiconductor diodes; Semiconductor optical amplifiers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices & IC's (ISPSD), 2010 22nd International Symposium on
  • Conference_Location
    Hiroshima
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4244-7718-0
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • Filename
    5543964