• DocumentCode
    526094
  • Title

    Simulation techniques for fault diagnosis of digital circuits based on LASAR

  • Author

    Wei, Su ; Manru, Gao ; Ying, Liu

  • Author_Institution
    Dept. of Electr. Eng., Beijing Union Univ., Beijing, China
  • Volume
    1
  • fYear
    2010
  • fDate
    12-13 June 2010
  • Firstpage
    386
  • Lastpage
    389
  • Abstract
    On the basis of scientific research projects recently completed by the author, and through analysis for contents of fault test, this paper makes a detailed description of methods for fault test, which provides fault dictionary method, coding method and comparison method. The assay mainly stipulates fault simulation analysis based on LASAR (Logic Automatic Stimulate and Response), and gives four major steps of the development for fault simulation software including modeling of tested unit, simulation of a normal board, fault simulation and post-treatment, and realizes 96.59% of fault coverage rate of excitations.
  • Keywords
    circuit simulation; digital circuits; digital simulation; fault simulation; LASAR; digital circuits; fault diagnosis; fault simulation software; normal board simulation; simulation techniques; Analytical models; Dictionaries; Load modeling; Digital Circuits; Fault Diagnosis; LASAR; Simulation Techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Communication Technologies in Agriculture Engineering (CCTAE), 2010 International Conference On
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-6944-4
  • Type

    conf

  • DOI
    10.1109/CCTAE.2010.5545152
  • Filename
    5545152