DocumentCode
526094
Title
Simulation techniques for fault diagnosis of digital circuits based on LASAR
Author
Wei, Su ; Manru, Gao ; Ying, Liu
Author_Institution
Dept. of Electr. Eng., Beijing Union Univ., Beijing, China
Volume
1
fYear
2010
fDate
12-13 June 2010
Firstpage
386
Lastpage
389
Abstract
On the basis of scientific research projects recently completed by the author, and through analysis for contents of fault test, this paper makes a detailed description of methods for fault test, which provides fault dictionary method, coding method and comparison method. The assay mainly stipulates fault simulation analysis based on LASAR (Logic Automatic Stimulate and Response), and gives four major steps of the development for fault simulation software including modeling of tested unit, simulation of a normal board, fault simulation and post-treatment, and realizes 96.59% of fault coverage rate of excitations.
Keywords
circuit simulation; digital circuits; digital simulation; fault simulation; LASAR; digital circuits; fault diagnosis; fault simulation software; normal board simulation; simulation techniques; Analytical models; Dictionaries; Load modeling; Digital Circuits; Fault Diagnosis; LASAR; Simulation Techniques;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Communication Technologies in Agriculture Engineering (CCTAE), 2010 International Conference On
Conference_Location
Chengdu
Print_ISBN
978-1-4244-6944-4
Type
conf
DOI
10.1109/CCTAE.2010.5545152
Filename
5545152
Link To Document