At-Speed Current testing for fault diagnosis of analogue circuits

Author

Guo, Chaoyou ; Ouyang, Guangyao ; Li, Yanfei

Author_Institution

Coll. of Naval Archit. & Power, Naval Univ. of Eng., Wuhan, China

Volume

7

fYear

2010

fDate

9-11 July 2010

Firstpage

326

Lastpage

328

Abstract

The At-Speed Current testing (IDDA) is adopted to detect faults for analogue circuits in this paper. The scheme of IDDA for analogue circuits is proposed that an input vector pair (V₀,V₁) repeats k times is applied to circuits under test enable a low-cost ATE or a waveform sensor to measure the average current or the current waveform. And a fault localization method for analogue circuits based on Artificial Immune System (AIS) was presented. The average current of IDDA is served as input parameters of AIS classifier to classify the different fault types. The PSPICE simulation results of continuous-time state-variable filter (ITC´97 set of benchmark circuits) indicate that IDDA is extremely effective to detect faults for analogue circuits.

Keywords

analogue circuits; automatic test equipment; continuous time filters; fault diagnosis; ATE; PSPICE simulation; analogue circuits; artificial immune system; at-speed current testing; automatic test equipment; continuous-time state-variable filter; current waveform; fault diagnosis; fault localization; input vector pair; waveform sensor; CMOS integrated circuits; Circuit faults; At-Speed Current testing; analogue circuit; artificial immune system; detect faults; supply current testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Science and Information Technology (ICCSIT), 2010 3rd IEEE International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-5537-9

Type

conf

DOI

10.1109/ICCSIT.2010.5565152

Filename

5565152