DocumentCode
530038
Title
An automatic through-hole inspection system by analyzing laser diffraction pattern
Author
Yoshino, Kazuyoshi ; Miwa, Motoatsu ; Kanamaru, Akihiro ; Kanai, Norikane
Author_Institution
Kanagawa Inst. of Technol., Atsugi, Japan
fYear
2010
fDate
18-21 Aug. 2010
Firstpage
2155
Lastpage
2160
Abstract
This paper describes a system for inspecting the inner surface of through-holes in a circuit board simultaneously and automatically. The system analyzes a diffraction pattern which appears in the shadow region around the through-holes by projecting a laser illumination on a circuit board. The diffraction pattern in the shadow region is generally observed with circular shape similar to the edge of the through-hole. However, radial fringes appear in the diffraction pattern of a through-hole, if the through-hole has defects on the inner surface itself. Our proposed system inspects a through-hole by processing an image captured the diffraction patter in the shadow region around the through-hole by a camera and finding fringes in the diffraction pattern. The system also inspects all through-holes in a whole circuit board by changing the capture area in the circuit board using a movable clamp automatically. In the experiment to evaluate our system, the system was able to detect only defective through-holes in a captured image including 20 through-holes whose diameter is 0.8 mm in a sample circuit board whose size is 90×68 mm. The time to inspect all 20 through-holes in the image was 0.35 second. And the time to inspect the whole sample circuit board was 77 seconds.
Keywords
automatic optical inspection; image processing; laser beam applications; light diffraction; printed circuit testing; automatic through hole inspection system; camera; circuit board; circular shape; fringes finding; image processing; laser diffraction pattern; laser illumination; radial fringes; Diffraction; Laser beams; Lasers; Lighting; Pixel; Printed circuits; X-ray diffraction; Image processing; Laser; Through-hole inspection;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE Annual Conference 2010, Proceedings of
Conference_Location
Taipei
Print_ISBN
978-1-4244-7642-8
Type
conf
Filename
5603988
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