• DocumentCode
    530038
  • Title

    An automatic through-hole inspection system by analyzing laser diffraction pattern

  • Author

    Yoshino, Kazuyoshi ; Miwa, Motoatsu ; Kanamaru, Akihiro ; Kanai, Norikane

  • Author_Institution
    Kanagawa Inst. of Technol., Atsugi, Japan
  • fYear
    2010
  • fDate
    18-21 Aug. 2010
  • Firstpage
    2155
  • Lastpage
    2160
  • Abstract
    This paper describes a system for inspecting the inner surface of through-holes in a circuit board simultaneously and automatically. The system analyzes a diffraction pattern which appears in the shadow region around the through-holes by projecting a laser illumination on a circuit board. The diffraction pattern in the shadow region is generally observed with circular shape similar to the edge of the through-hole. However, radial fringes appear in the diffraction pattern of a through-hole, if the through-hole has defects on the inner surface itself. Our proposed system inspects a through-hole by processing an image captured the diffraction patter in the shadow region around the through-hole by a camera and finding fringes in the diffraction pattern. The system also inspects all through-holes in a whole circuit board by changing the capture area in the circuit board using a movable clamp automatically. In the experiment to evaluate our system, the system was able to detect only defective through-holes in a captured image including 20 through-holes whose diameter is 0.8 mm in a sample circuit board whose size is 90×68 mm. The time to inspect all 20 through-holes in the image was 0.35 second. And the time to inspect the whole sample circuit board was 77 seconds.
  • Keywords
    automatic optical inspection; image processing; laser beam applications; light diffraction; printed circuit testing; automatic through hole inspection system; camera; circuit board; circular shape; fringes finding; image processing; laser diffraction pattern; laser illumination; radial fringes; Diffraction; Laser beams; Lasers; Lighting; Pixel; Printed circuits; X-ray diffraction; Image processing; Laser; Through-hole inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SICE Annual Conference 2010, Proceedings of
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-7642-8
  • Type

    conf

  • Filename
    5603988