Improved C-V segmentation model based on local information for pavement distress images

The digital image processing system for pavement distress assessment benefits from good segmentation technologies because a accurate segmentation result leads to correct defect recognition and accurate assessment. In this paper, an improved C-V segmentation method based on a narrow band of the active contour line is proposed. The method substitutes the local region with a narrow band of the active contour line in the local region C-V model. Further, in the iteration equation, the original image is replaced by the gradient image to process pavement distress images. The experimental results show that the inhomogeneous objects could be segmented effectively and achieve good results.