• DocumentCode
    537094
  • Title

    Study on a Flash Relay Test Device and Simulated Load

  • Author

    Liu Zhaofeng ; Yan Qiao ; Zhang Yuanguo

  • Author_Institution
    Inf. & Electr. Eng. Sch., Shandong Jianzhu Univ., Jinan, China
  • fYear
    2010
  • fDate
    7-9 Nov. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A single-chip microcomputer-based test device of flash relay is presented in this paper, whose circuit and testing method are also introduced. The test device can not only detect parameters of relays in dynamic process, but also has additional functions such as durability detection, failure indication and so on. Finally, a simulated load circuit aiming at improving the test environment is designed, whose characteristic is similar as that of the practical load.
  • Keywords
    automotive electronics; microprocessor chips; relays; test equipment; durability detection; dynamic process; failure indication; flash relay test device; simulated load; simulated load circuit; single chip microcomputer based test device; testing method; Algorithms; Integrated circuit modeling; Load modeling; Relays; Switches; Testing; Time frequency analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
  • Conference_Location
    Henan
  • Print_ISBN
    978-1-4244-7159-1
  • Type

    conf

  • DOI
    10.1109/ICEEE.2010.5660987
  • Filename
    5660987