DocumentCode
537094
Title
Study on a Flash Relay Test Device and Simulated Load
Author
Liu Zhaofeng ; Yan Qiao ; Zhang Yuanguo
Author_Institution
Inf. & Electr. Eng. Sch., Shandong Jianzhu Univ., Jinan, China
fYear
2010
fDate
7-9 Nov. 2010
Firstpage
1
Lastpage
4
Abstract
A single-chip microcomputer-based test device of flash relay is presented in this paper, whose circuit and testing method are also introduced. The test device can not only detect parameters of relays in dynamic process, but also has additional functions such as durability detection, failure indication and so on. Finally, a simulated load circuit aiming at improving the test environment is designed, whose characteristic is similar as that of the practical load.
Keywords
automotive electronics; microprocessor chips; relays; test equipment; durability detection; dynamic process; failure indication; flash relay test device; simulated load; simulated load circuit; single chip microcomputer based test device; testing method; Algorithms; Integrated circuit modeling; Load modeling; Relays; Switches; Testing; Time frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
E-Product E-Service and E-Entertainment (ICEEE), 2010 International Conference on
Conference_Location
Henan
Print_ISBN
978-1-4244-7159-1
Type
conf
DOI
10.1109/ICEEE.2010.5660987
Filename
5660987
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