DocumentCode
54541
Title
Calibration of a Novel Microstructural Damage Model for Wire Bonds
Author
Yang, L. ; Agyakwa, P.A. ; Johnson, C.M.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham, UK
Volume
14
Issue
4
fYear
2014
fDate
Dec. 2014
Firstpage
989
Lastpage
994
Abstract
In a previous paper, a new time-domain damage-based physics model was proposed for the lifetime prediction of wire bond interconnects in power electronic modules. Unlike cycle-dependent life prediction methodologies, this model innovatively incorporates temperature- and time-dependent properties so that rate-sensitive processes associated with the bond degradation can be accurately represented. This paper presents the work on the development and calibration of the damage model by linking its core parameter, i.e., “damage,” to the strain energy density, which is a physically quantifiable materials property. Isothermal uniaxial tensile data for unbonded pure aluminum wires (99.999%) have been used to develop constitutive functions, and the model has been calibrated by the derived values of the strain energy density.
Keywords
interconnections; lead bonding; power electronics; time-domain analysis; bond degradation; cycle-dependent life prediction methodologies; isothermal uniaxial tensile data; microstructural damage model; power electronic modules; strain energy density; temperature-dependent properties; time-dependent properties; time-domain damage-based physics model; unbonded pure aluminum wires; wire bond interconnects; Equations; Mathematical model; Plastics; Strain; Stress; Temperature dependence; Wires; Wire bond; damage model; physics of failure; time domain;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2014.2354739
Filename
6891277
Link To Document