• DocumentCode
    54541
  • Title

    Calibration of a Novel Microstructural Damage Model for Wire Bonds

  • Author

    Yang, L. ; Agyakwa, P.A. ; Johnson, C.M.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Nottingham, Nottingham, UK
  • Volume
    14
  • Issue
    4
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    989
  • Lastpage
    994
  • Abstract
    In a previous paper, a new time-domain damage-based physics model was proposed for the lifetime prediction of wire bond interconnects in power electronic modules. Unlike cycle-dependent life prediction methodologies, this model innovatively incorporates temperature- and time-dependent properties so that rate-sensitive processes associated with the bond degradation can be accurately represented. This paper presents the work on the development and calibration of the damage model by linking its core parameter, i.e., “damage,” to the strain energy density, which is a physically quantifiable materials property. Isothermal uniaxial tensile data for unbonded pure aluminum wires (99.999%) have been used to develop constitutive functions, and the model has been calibrated by the derived values of the strain energy density.
  • Keywords
    interconnections; lead bonding; power electronics; time-domain analysis; bond degradation; cycle-dependent life prediction methodologies; isothermal uniaxial tensile data; microstructural damage model; power electronic modules; strain energy density; temperature-dependent properties; time-dependent properties; time-domain damage-based physics model; unbonded pure aluminum wires; wire bond interconnects; Equations; Mathematical model; Plastics; Strain; Stress; Temperature dependence; Wires; Wire bond; damage model; physics of failure; time domain;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2014.2354739
  • Filename
    6891277