• DocumentCode
    545915
  • Title

    On the practical applicability of series expansions for Kirchhoff diffractals

  • Author

    Perna, S. ; Iodice, A.

  • Author_Institution
    DiT, Univ. degli Studi di Napoli Parthenope, Naples, Italy
  • fYear
    2011
  • fDate
    11-15 April 2011
  • Firstpage
    10
  • Lastpage
    13
  • Abstract
    Use of the Kirchhoff approach allows expressing the electromagnetic field scattered by a fractal surface in terms of two series with different convergence regions. Convergence properties of these series and problems arising in their numerical evaluation have been presented in recent literature. In particular, suitable truncation criteria have been devised, which allow practical use of these two series expansions for computation of the scattered field with a controlled error. Based on the analysis provided by the recent literature, in this work an algorithm is presented that, given the illumination and surface roughness parameters, computes the scattered power density by automatically selecting the most appropriate series and truncation criterion.
  • Keywords
    electromagnetic wave diffraction; electromagnetic wave scattering; surface roughness; Kirchhoff approach; controlled error; diffraction; electromagnetic field scattering; fractal surface; surface roughness parameters; Accuracy; Computers; Fractals; Rough surfaces; Scattering; Surface roughness; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (EUCAP), Proceedings of the 5th European Conference on
  • Conference_Location
    Rome
  • Print_ISBN
    978-1-4577-0250-1
  • Type

    conf

  • Filename
    5781164