• DocumentCode
    551800
  • Title

    Analysis of charge transfer inefficiency of CCD equipment under proton radiation

  • Author

    Hou, Rui ; Zhao, Shanghong ; Yao, Zhoushi ; Xu, Jie ; Jiang, Xiaofeng

  • Author_Institution
    Telecommun. Eng. Inst., Air Force Eng. Univ., Xi´´an, China
  • Volume
    2
  • fYear
    2011
  • fDate
    29-31 July 2011
  • Abstract
    The charge coupled device(CCD) is the key component of beacon light subsystem in optical satellite communication system. The influences of space radiation environment on CCD´s charge transfer efficiency(CTE) and its dark current are theoretically analyzed. Based on the analysis the induced CTE degradations under some typical operation temperatures and particle fluences are numerically calculated. The calculation results have proved that adding shielding layers and temperature controlling unit are both the efficient ways to improve the radiation hardness of optical satellite communication system.
  • Keywords
    charge exchange; charge-coupled devices; optical communication equipment; optical control; satellite communication; temperature control; CCD equipment; charge coupled device; charge transfer efficiency; dark current; light subsystem; optical satellite communication system; proton radiation; radiation hardness; shielding layers; space radiation; temperature controlling unit; Charge coupled devices; Observatories; Optical attenuators; Satellites; CCD; bulk trap; charge transfer efficiency; space radiation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and Optoelectronics (ICEOE), 2011 International Conference on
  • Conference_Location
    Dalian
  • Print_ISBN
    978-1-61284-275-2
  • Type

    conf

  • DOI
    10.1109/ICEOE.2011.6013232
  • Filename
    6013232