• DocumentCode
    552186
  • Title

    Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF

  • Author

    Qiu, Jifang ; Yin, Zuoshan ; Sun, Kai ; Chen, Lawrence R. ; Rochette, Martin ; Wu, Jian ; Zhao, Lingjuan ; Wang, Wei

  • Author_Institution
    Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
  • fYear
    2011
  • fDate
    4-8 July 2011
  • Firstpage
    573
  • Lastpage
    574
  • Abstract
    We investigate the wavelength-dependent performance of an all-optical multi-logic gate based on XPM. Simulation results show that this scheme is applicable over the whole C-band when the wavelength separation is between 4nm and 33nm.
  • Keywords
    nonlinear optics; optical logic; optical modulation; HNLF; XPM; all-optical multilogic gate; wavelength 4 nm to 33 nm; wavelength separation; wavelength tolerance; Adaptive optics; Logic gates; Modulation; Optical sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Opto-Electronics and Communications Conference (OECC), 2011 16th
  • Conference_Location
    Kaohsiung
  • Print_ISBN
    978-1-61284-288-2
  • Electronic_ISBN
    978-986-02-8974-9
  • Type

    conf

  • Filename
    6015268
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=552186