Mathematical Modeling and Analysis of a Very Low Frequency HV Test System

Author

Eberharter, Stefan ; Kemmetmuller, Wolfgang ; Kugi, A.

Author_Institution

Autom. & Control Inst., Vienna Univ. of Technol., Vienna, Austria

Volume

29

Issue

11

fYear

2014

fDate

Nov. 2014

Firstpage

5784

Lastpage

5794

Abstract

This paper presents a new type of very low frequency (VLF) high-voltage test system for on-site cable tests up to 200 kV rms. The VLF system is based on a so called differential resonance technology (DRT), which enables a light-weight and compact construction of cable test systems. A mathematical model of the test system is presented, which is used for a detailed analysis and optimization of the DRT system. Measurement results on a prototype for 200 kV rms and loads up to 0.75 μF are used to validate the mathematical model and to show the feasibility of the test system.

Keywords

high-voltage techniques; mathematical analysis; power cable testing; cable test systems; differential resonance technology; mathematical modeling; on-site cable tests; very low frequency HV test system; Capacitance; Demodulation; Mathematical model; Multichip modules; Power cables; Resonant frequency; Thyristors; Cable testing; high-voltage; mathematical modeling; on-site testing; very low frequency;

fLanguage

English

Journal_Title

Power Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0885-8993

Type

jour

DOI

10.1109/TPEL.2014.2299293

Filename

6708472