• DocumentCode
    552440
  • Title

    Improved feature selection based on scatter degree

  • Author

    Zare, Arman ; Fouladi, Seyyed Hamed

  • Author_Institution
    Dept. of Electron. Eng., Amirkabir Univ., Tehran, Iran
  • Volume
    1
  • fYear
    2011
  • fDate
    10-13 July 2011
  • Firstpage
    97
  • Lastpage
    101
  • Abstract
    Feature reduction is important in machine learning, data mining and pattern recognition fields. Feature reduction consists of two methods: 1. Feature Extraction 2. Feature Selection. Feature selection methods try to select feature subset from feature set. Thus high dimension documents are projected on to lower dimension documents. The goal is selection of best subset that causes minimum error in classification. Scatter degree is one of the feature selection methods which attributes a degree of scattering for each feature. Features are selected that have higher scatter degree. In this paper, classification error has been reduced by considering other aspects in computing scatter degree (Improved Scatter Degree). Obtained results from this method have been compared with Scatter degree method.
  • Keywords
    data mining; document handling; feature extraction; learning (artificial intelligence); pattern classification; classification error; data mining; feature extraction; feature reduction; feature selection methods; improved feature selection; machine learning; pattern recognition; scatter degree; Algorithm design and analysis; Cybernetics; Equations; Feature extraction; Machine learning; Mathematical model; Principal component analysis; Feature selection; Pattern recognition; Scatter degree;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics (ICMLC), 2011 International Conference on
  • Conference_Location
    Guilin
  • ISSN
    2160-133X
  • Print_ISBN
    978-1-4577-0305-8
  • Type

    conf

  • DOI
    10.1109/ICMLC.2011.6016668
  • Filename
    6016668