• DocumentCode
    555313
  • Title

    Dealing with noise in defect prediction

  • Author

    Kim, Sunghun ; Zhang, Hongyu ; Wu, Rongxin ; Gong, Liang

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2011
  • fDate
    21-28 May 2011
  • Firstpage
    481
  • Lastpage
    490
  • Abstract
    Many software defect prediction models have been built using historical defect data obtained by mining software repositories (MSR). Recent studies have discovered that data so collected contain noises because current defect collection practices are based on optional bug fix keywords or bug report links in change logs. Automatically collected defect data based on the change logs could include noises. This paper proposes approaches to deal with the noise in defect data. First, we measure the impact of noise on defect prediction models and provide guidelines for acceptable noise level. We measure noise resistant ability of two well-known defect prediction algorithms and find that in general, for large defect datasets, adding FP (false positive) or FN (false negative) noises alone does not lead to substantial performance differences. However, the prediction performance decreases significantly when the dataset contains 20%-35% of both FP and FN noises. Second, we propose a noise detection and elimination algorithm to address this problem. Our empirical study shows that our algorithm can identify noisy instances with reasonable accuracy. In addition, after eliminating the noises using our algorithm, defect prediction accuracy is improved.
  • Keywords
    data mining; program debugging; program testing; MSR; bug report links; false negative noise; false positive noise; historical defect data; mining software repositories; optional bug fix keywords; software defect prediction models; Electrical resistance measurement; Noise; Noise measurement; Prediction algorithms; Predictive models; Resistance; Training; buggy changes; buggy files; data quality; defect prediction; noise resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2011 33rd International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4503-0445-0
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1985793.1985859
  • Filename
    6032487