• DocumentCode
    555432
  • Title

    Test blueprint: an effective visual support for test coverage

  • Author

    Araya, Vanessa Peña

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Chile, Santiago, Chile
  • fYear
    2011
  • fDate
    21-28 May 2011
  • Firstpage
    1140
  • Lastpage
    1142
  • Abstract
    Test coverage is about assessing the relevance of unit tests against the tested application. It is widely acknowledged that a software with a "good" test coverage is more robust against unanticipated execution, thus lowering the maintenance cost. However, insuring a coverage of a good quality is challenging, especially since most of the available test coverage tools do not discriminate software components that require a "strong" coverage from the components that require less attention from the unit tests. HAPAO is an innovative test covepage tool, implemented in the Pharo Smalltalk programming language. It employs an effective and intuitive graphical representation to visually assess the quality of the coverage. A combination of appropriate metrics and relations visually shapes methods and classes, which indicates to the programmer whether more effort on testing is required. This paper presents the essence of HAPAO using a real world case study.
  • Keywords
    object-oriented languages; object-oriented programming; program testing; program visualisation; software cost estimation; software maintenance; software metrics; software quality; software tools; HAPAO test coverage tool; Pharo Smalltalk programming language; graphical representation; software component; software maintenance cost; software metrics; software quality; software test coverage; test blueprint; test coverage visual support; unit tests; Complexity theory; Computer languages; Context; Measurement; Software; Testing; Visualization; coverage; pharo; testing; visualization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering (ICSE), 2011 33rd International Conference on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0270-5257
  • Print_ISBN
    978-1-4503-0445-0
  • Electronic_ISBN
    0270-5257
  • Type

    conf

  • DOI
    10.1145/1985793.1986022
  • Filename
    6032614