DocumentCode
558294
Title
Optimum position of the two-dimensional electron gas sample in the cryogenic metallic cavity system used in studying Ratchet Effect
Author
Medhat, D. ; Takacs, A. ; Aubert, H.
Author_Institution
LAAS, Toulouse, France
fYear
2011
fDate
10-13 Oct. 2011
Firstpage
964
Lastpage
967
Abstract
This paper introduces electromagnetic simulation models representing the complex experimental metallic cavity setup used in the investigation of Ratchet Effect in semiconductor heterojunction sample, at low temperature. The optimum position of the semiconductor sample inside this metallic cavity can be estimated depending on; the distribution of the electric field inside the cavity, the uniformity of the incident electric field linear polarization and the uniformity of the incident electric field density on the sample surface.
Keywords
carrier mobility; cryogenics; semiconductor heterojunctions; two-dimensional electron gas; Ratchet effect; cryogenic metallic cavity system; electromagnetic simulation model; incident electric field density; linear polarization; optimum position; semiconductor heterojunction; two-dimensional electron gas sample; Apertures; Cavity resonators; Computational modeling; Electric fields; Microwave theory and techniques; Portals; Waveguide transitions; Ratchet Effect at low temperature; complex experimental metallic cavity; electric field distribution; electromagnetic simulation models; energy harvesting; uniformity of the electric field density; uniformity of the electric field linear polarization; wireless power transfer;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2011 41st European
Conference_Location
Manchester
Print_ISBN
978-1-61284-235-6
Type
conf
Filename
6101938
Link To Document