• DocumentCode
    55898
  • Title

    High Area-Efficient DC-DC Converter With High Reliability Using Time-Mode Miller Compensation (TMMC)

  • Author

    Sung-Wan Hong ; Tae-Hwang Kong ; Sang-hui Park ; Changbyung Park ; Seungchul Jung ; Sungwoo Lee ; Gyu-Hyeong Cho

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • Volume
    48
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2457
  • Lastpage
    2468
  • Abstract
    This paper presents a novel on-chip compensation scheme, the Time-Mode Miller Compensation (TMMC), for DC-DC converter in which the compensation components are integrated on-chip. Using this proposed scheme, the DC-DC converter is stably compensated and insensitive to process variations, with significantly small compensation components ( 1 pF and 80 kΩ in this work) consuming very small silicon area owing to the characteristic of the TMMC. The small compensation components make the chip size small, with 0.12 mm2 of core area (w/o power transistors) using 0.18 μm I/O process. This core size is as small as that of the digital DC-DC converters implemented with less than sub-50 nm process. The measurement result shows that the maximum power efficiency of 90.6% is obtained at the load current of 220 mA with the switching frequency of 1.15 MHz when the input and the output voltages are 3.3 V and 2 V, respectively.
  • Keywords
    DC-DC power convertors; compensation; reliability; switching convertors; I-O process; TMMC; compensation component; current 220 mA; frequency 1.15 MHz; high area-efficient DC-DC converter; load current; maximum power efficiency; on-chip compensation scheme; size 0.18 mum; switching frequency; time-mode Miller compensation; voltage 2 V; voltage 3.3 V; Capacitance; Capacitors; Inductors; Radiation detectors; Reliability; Switches; System-on-chip; Cost efficiency; DC-DC power conversion; Miller compensation; on-chip compensation; process variation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2272845
  • Filename
    6566181