• DocumentCode
    559638
  • Title

    Reliable system-level models for electrostatically actuated devices under varying ambient conditions: Modeling and validation

  • Author

    Schrag, Gabriele ; Niessner, Martin ; Wachutka, Gerhard

  • Author_Institution
    Inst. for Phys. of Electrotechnol., Munich Univ. of Technol., München, Germany
  • fYear
    2011
  • fDate
    11-13 May 2011
  • Firstpage
    8
  • Lastpage
    13
  • Abstract
    We present a physics-based multi-energy domain macromodel that allows - in general - for the efficient simulation of any electrostatic actuator within standard IC frameworks and apply it exemplarily to an RF-MEMS switch. The predictive power of this macromodel, which depends crucially on the quality of the applied damping and contact models, has been evaluated by white light interferometer and laser vibrometer measurements. It turned out that the models for viscous damping as well as for the electromechanical energy domain are in very good agreement with the experiments while the applied standard contact model fails in reproducing the measured contact phenomena. Based on these findings suggestions for improved system-level contact models are discussed.
  • Keywords
    electrostatic actuators; microswitches; vibration measurement; IC framework; RF-MEMS switch; applied damping model; electromechanical energy domain; electrostatic actuator; electrostatically actuated devices; laser vibrometer measurement; physics-based multienergy domain macromodel; predictive power; system-level contact model; system-level model reliability; viscous damping; white light interferometer; Contacts; Damping; Electrodes; Integrated circuit modeling; Mathematical model; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2011 Symposium on
  • Conference_Location
    Aix-en-Provence
  • Print_ISBN
    978-1-61284-905-8
  • Type

    conf

  • Filename
    6108050