DocumentCode
560479
Title
An on-chip sensor for time domain characterization of electromagnetic interferences
Author
Boyer, A. ; Ben Dhia, S. ; Lemoine, C. ; Vrignon, B.
Author_Institution
LAAS, INSA de Toulouse, Toulouse, France
fYear
2011
fDate
6-9 Nov. 2011
Firstpage
251
Lastpage
256
Abstract
With the growing concerns about susceptibility of integrated circuits to electromagnetic interferences, the need for accurate prediction tools and models to reduce risks of non-compliance becomes critical for circuit designers. However, on-chip characterization of noise is still necessary for model validation. This paper presents an on-chip noise sensor dedicated to the time-domain measurement of voltage fluctuations induced by interference coupling.
Keywords
electric sensing devices; electromagnetic interference; integrated circuit design; microprocessor chips; time-domain analysis; circuit designers; electromagnetic interferences; integrated circuits; interference coupling; noise characterization; on-chip noise sensor; time domain characterization; voltage fluctuations; Delay; Fluctuations; Noise; Semiconductor device measurement; System-on-a-chip; Voltage fluctuations; Voltage measurement; conducted susceptibility; integrated circuits; on-chip measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility of Integrated Circuits (EMC Compo), 2011 8th Workshop on
Conference_Location
Dubrovnik
Print_ISBN
978-1-4577-0862-6
Type
conf
Filename
6130073
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