DocumentCode
567539
Title
Empirical comparison of bagging-based ensemble classifiers
Author
Ye, Ren ; Suganthan, P.N.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2012
fDate
9-12 July 2012
Firstpage
917
Lastpage
924
Abstract
This paper compares empirically four bagging-based ensemble classifiers, namely the ensemble adaptive neuro-fuzzy inference system (ANFIS), the ensemble support vector machine (SVM), the ensemble extreme learning machine (ELM) and the random forest. The comparison of these four ensemble classifiers is novel because it has not been reported in the existing literature. The classifiers are evaluated with thirteen binary class datasets and the empirical results show that the ensemble methods employed in the four ensemble classifiers boost the testing accuracy by 1-5% on average from their base classifiers. In addition, the testing accuracy can be improved by increasing the number of base classifiers. The empirical results also show that the bagging SVM is the most favorable ensemble classifier among them.
Keywords
fuzzy neural nets; fuzzy reasoning; learning (artificial intelligence); pattern classification; random processes; support vector machines; ANFIS; ELM; bagging SVM; bagging-based ensemble classifier; base classifier; binary class dataset; ensemble adaptive neuro-fuzzy inference system; ensemble extreme learning machine; ensemble support vector machine; random forest; Accuracy; Bagging; Decision trees; Kernel; Support vector machines; Testing; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Fusion (FUSION), 2012 15th International Conference on
Conference_Location
Singapore
Print_ISBN
978-1-4673-0417-7
Electronic_ISBN
978-0-9824438-4-2
Type
conf
Filename
6289900
Link To Document