DocumentCode
568020
Title
Low-temperature solution process for oxide TFT
Author
Jeong, Woong Hee ; Kim, Dong Lim ; Kim, Hyun Jae
Author_Institution
Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
fYear
2012
fDate
4-6 July 2012
Firstpage
301
Lastpage
304
Abstract
The importance of the low-temperature solution process for oxide thin-film transistor (TFT) is growing as the demand on the ultra-large and flexible display is increased. Among diverse approaches for the low-temperature solution process, the formation of dual active layer and utilization of nitrate precursor are proposed in this paper. From electrical and structural analyses, the two proposed approaches proved their competence as effective solutions to achieve high performance TFT in low-temperature annealing below 350°C.
Keywords
annealing; liquid phase deposition; thin film transistors; thin films; dual active layer formation; effective solutions; electrical analysis; flexible display; high performance thin-film transistor; low-temperature annealing; low-temperature solution process; nitrate precursor utilization; oxide thin-film transistor; structural analysis; ultralarge display; Annealing; Films; Iron; Temperature; Thin film transistors; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
Conference_Location
Kyoto
Print_ISBN
978-1-4673-0399-6
Type
conf
Filename
6294910
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