• DocumentCode
    568020
  • Title

    Low-temperature solution process for oxide TFT

  • Author

    Jeong, Woong Hee ; Kim, Dong Lim ; Kim, Hyun Jae

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2012
  • fDate
    4-6 July 2012
  • Firstpage
    301
  • Lastpage
    304
  • Abstract
    The importance of the low-temperature solution process for oxide thin-film transistor (TFT) is growing as the demand on the ultra-large and flexible display is increased. Among diverse approaches for the low-temperature solution process, the formation of dual active layer and utilization of nitrate precursor are proposed in this paper. From electrical and structural analyses, the two proposed approaches proved their competence as effective solutions to achieve high performance TFT in low-temperature annealing below 350°C.
  • Keywords
    annealing; liquid phase deposition; thin film transistors; thin films; dual active layer formation; effective solutions; electrical analysis; flexible display; high performance thin-film transistor; low-temperature annealing; low-temperature solution process; nitrate precursor utilization; oxide thin-film transistor; structural analysis; ultralarge display; Annealing; Films; Iron; Temperature; Thin film transistors; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-0399-6
  • Type

    conf

  • Filename
    6294910