• DocumentCode
    569851
  • Title

    Degradation failure model of electromagnetic relay

  • Author

    Ye Xuerong ; Ma Yue ; Meng Hang ; Zhai Guofu

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Harbin Inst. of Tech., Harbin, China
  • fYear
    2012
  • fDate
    14-17 May 2012
  • Firstpage
    116
  • Lastpage
    123
  • Abstract
    Electromagnetic relay (EMR) is a kind of high failure rate component in control system, the accuracy of its reliability prediction plays a significant role in the system reliability estimation. Currently, post-analysis methods didn´t consider the influence of different application environment of EMR, only using some coefficients to revise the prediction results. In fact, the failure process and failure mechanisms of EMR may totally change along with the environment. This paper collects the failure process data of EMR, and studies the degradation characteristics under different failure mode, finally establishes and proposes the regression degradation model and the failure physical degradation model of relay contacts respectively, and verifies the accuracy through the life prediction based on the model.
  • Keywords
    electromagnetic devices; failure analysis; regression analysis; relays; reliability; control system; degradation failure model; electromagnetic relay; failure physical degradation; life prediction; regression degradation; reliability estimation; reliability prediction; degradation failure model; failure mechanisms; physics of failure; relay;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Electrical Contacts (ICEC 2012), 26th International Conference on
  • Conference_Location
    Beijing
  • Electronic_ISBN
    978-1-84919-508-9
  • Type

    conf

  • DOI
    10.1049/cp.2012.0633
  • Filename
    6301878