• DocumentCode
    572321
  • Title

    Simplified Algorithm of Voltage Security Correction Based on Sensitivity Analysis Method

  • Author

    Tang, Maolin ; Zhu, Qingdai ; Yang, Ke ; Zhang, Hongtu ; Li, Xiang ; Huang, Yang ; Chen, Lei ; Hu, Wei

  • Author_Institution
    Dispatching & Commun. Center, Sichuan Electr. Power Corp., Chengdu, China
  • fYear
    2012
  • fDate
    27-29 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Voltage stability is a crucial factor in power system operation. When bus voltage exceeds the operation limits because of change of the operation mode, load in the network or the environmental factors, appropriate control actions should be taken to guarantee a secure system operation, avoiding emergency situations or voltage collapse. Development and improvement of the algorithm for voltage security correction is a significant subject. This paper makes several improvements on the usual voltage security correction algorithms, and a new simplified algorithm based on sensitivity analysis is proposed. Emphasize is placed on the reduction of calculation scale in the selection of the control devices, fast calculation of the sensitivities and the calculation of the adjustment quantities. With only a few buses involved in the calculation, the simplified correction algorithm can guarantee high-speed and accuracy in most cases and is especially useful for online applications. An example of the New England 39 buses system is used to verify the effectiveness of the simplified algorithm.
  • Keywords
    power system security; sensitivity analysis; voltage control; control device; power system operation; secure system operation; sensitivity analysis method; voltage collapse; voltage security correction; Algorithm design and analysis; Generators; Power system stability; Security; Sensitivity analysis; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2012 Asia-Pacific
  • Conference_Location
    Shanghai
  • ISSN
    2157-4839
  • Print_ISBN
    978-1-4577-0545-8
  • Type

    conf

  • DOI
    10.1109/APPEEC.2012.6307599
  • Filename
    6307599