• DocumentCode
    572386
  • Title

    Research on Electric Field Strength Distortion near the Insulators When There Is Any Guano-Caused Flashover of Insulators of Power Transmission Lines

  • Author

    Zheng Jingwen ; Li Yuchao

  • Author_Institution
    Sch. of Electr. Eng., Wuhan Univ., Wuhan, China
  • fYear
    2012
  • fDate
    27-29 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Along with the rapid development and continuous deepening of the market economy system, the whole society´s demands for safe and high-quality services of power system have been becoming higher and higher. However, the flashover of insulators of power transmission lines caused by guano frequently threatens the safe and reliable operation of the power transmission lines, which can cause tremendous economic losses to the power industry. This paper describes the occurrence mechanisms for flashover faults of insulators of power transmission lines, and carries out simple simulation and modeling research to summarize the preliminary data drawn from the research, meanwhile, the theoretical results have been obtained by virtue of some relevant materials, which has provided theoretical bases and methods for reducing and or even preventing the guano-caused flashover faults of insulators of power transmission lines, therefore, it is of great significance in protecting the safe and stable operation of power grid and reducing the losses caused by the guano-caused flashover faults of insulators of power transmission lines.
  • Keywords
    electric fields; flashover; insulator contamination; power transmission faults; electric field strength distortion; electric insulators; flashover faults; guano caused flashover; power transmission lines; Analytical models; Electric fields; Finite element methods; Flashover; Insulators; Power transmission lines; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2012 Asia-Pacific
  • Conference_Location
    Shanghai
  • ISSN
    2157-4839
  • Print_ISBN
    978-1-4577-0545-8
  • Type

    conf

  • DOI
    10.1109/APPEEC.2012.6307744
  • Filename
    6307744