• DocumentCode
    577916
  • Title

    Highly efficient, polarization insensitive terahertz metamaterial perfect absorber and imaging

  • Author

    Wilbert, David S. ; Hokmabadi, Mohammad P. ; Baughman, William ; Kung, Patrick ; Kim, Seongsin M.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Alabama, Tuscaloosa, AL, USA
  • fYear
    2012
  • fDate
    23-27 Sept. 2012
  • Firstpage
    228
  • Lastpage
    229
  • Abstract
    In this work we present the design, simulation and characterization of a novel thin, tunable, polarization insensitive metamaterial absorber structures which can behave as a perfect absorber at THz frequencies. Each unit cell of the absorber is made up of two metallic structures separated by a dielectric filler material. The electric response can be tuned by adjusting the geometry of the top metallic electric ring resonator structure, which was designed to contain a square closed ring with four plates arranged 90o from one another inside the ring. These plates form 45o gaps in order to generate an electric response at any incident field polarization. The ground plane provides freedom to place the absorber device on any desired surface since no transmission is allowed beyond the metallic plane. The magnetic response generated by the absorber structure occurs between the two metallic layers. As a result the magnetic response, and thus the absorption, is highly dependent on the dielectric layer thickness.
  • Keywords
    light polarisation; metamaterials; optical design techniques; terahertz materials; absorber device; dielectric filler material; dielectric layer thickness; electric response; imaging; incident field polarization; magnetic response; metallic electric ring resonator structure; polarization insensitive terahertz metamaterial absorber; Absorption; Dielectrics; Magnetic materials; Magnetic resonance imaging; Magnetic separation; Metamaterials; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics Conference (IPC), 2012 IEEE
  • Conference_Location
    Burlingame, CA
  • Print_ISBN
    978-1-4577-0731-5
  • Type

    conf

  • DOI
    10.1109/IPCon.2012.6358575
  • Filename
    6358575