• DocumentCode
    586897
  • Title

    Review on VCO based ADC in modern deep submicron CMOS technology

  • Author

    Hon Cheong Hor ; Siek, Liter

  • Author_Institution
    IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    21-23 Nov. 2012
  • Firstpage
    86
  • Lastpage
    88
  • Abstract
    The continuous scaling in CMOS technology has driven researchers to look for new ADC architecture that can work well in lower supply voltage and smaller device dimension. VCO-based ADCs have emerged as an attractive solution due to its highly digital intensive circuit architecture, inherent noise shaping characteristic, as well as anti-aliasing property. However, the nonlinear behavior of VCO´s voltage-to-frequency characteristic has severe limitation on the performance of VCO-based ADC. This paper presents recent development in VCO-based ADC with different VCO nonlinearity suppression techniques. The advantage and disadvantage of each of these techniques will be reviewed.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; voltage-controlled oscillators; VCO nonlinearity suppression technique; VCO voltage-to-frequency characteristic; VCO-based ADC architecture; antialiasing property; digital intensive circuit architecture; inherent noise shaping characteristic; modern deep submicron CMOS technology; nonlinear behavior; CMOS integrated circuits; CMOS technology; Calibration; Delay; Pulse width modulation; Sigma delta modulation; Voltage-controlled oscillators; Digital like ADC; VCO based ADC; all-digital ADC; time-mode ADC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio-Frequency Integration Technology (RFIT), 2012 IEEE International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2303-1
  • Type

    conf

  • DOI
    10.1109/RFIT.2012.6401622
  • Filename
    6401622