• DocumentCode
    589582
  • Title

    Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for MLC NAND flash memory

  • Author

    Kong, Guowei ; Kim, T. ; Xi, Wei ; Choi, Soon-Mi

  • Author_Institution
    Yonsei Univ., Seoul, South Korea
  • fYear
    2012
  • fDate
    Oct. 31 2012-Nov. 2 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Cell-to-cell interference compensation schemes using reduced symbol pattern of interfering cells for multi-level cell (MLC) NAND flash memory are proposed in this paper. The proposed schemes contain three signal-processing techniques, estimating cell-to-cell interference, compensating cell-to-cell interference, and generating log-likelihood ratio (LLR). Firstly, reduced symbol pattern of interfering cells is used to easily estimate cell-to-cell interference by setting threshold voltage shift to be only two values in the programming state. Based on this estimation, cell-to-cell interference is compensated by modifying the read voltage in the proposed scheme 1 and by subtracting the estimated cell-to-cell interference from the sensed voltage in the proposed scheme 2. Finally, after conducting compensation, LLR is calculated for low-density parity check codes in the assumption of free cell-to-cell interference since interference between cells is mitigated by the compensation procedure. By using these techniques, the interference can be relaxed with a simpler structure and a higher reliability compared to the conventional methods for MLC NAND flash memory.
  • Keywords
    NAND circuits; compensation; flash memories; parity check codes; signal processing; LLR; MLC NAND flash memory; cell-to-cell interference compensation schemes; cell-to-cell interference estimation; compensation procedure; generating log-likelihood ratio; interfering cells; low-density parity check codes; multilevel cell NAND flash memory; programming state; reduced symbol pattern; sensed voltage; signal-processing techniques; threshold voltage shift; Bit error rate; Flash memory; Interference; Parity check codes; Reliability; Sensors; Threshold voltage; Cell-to-Cell interference; MLC NAND flash memory; interference compensation; low-density parity check (LDPC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    APMRC, 2012 Digest
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-4734-1
  • Type

    conf

  • Filename
    6407527