• DocumentCode
    596903
  • Title

    A RF/DC current-mode detector for BiST and digital calibration of current-driven mixers

  • Author

    Feiran Lei ; Yenamandra, V. ; Bibyk, Steven ; Ismail, Mahamod

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    729
  • Lastpage
    732
  • Abstract
    This paper presents a CMOS RF/DC current-mode detector as an essential requirement to realize Built-in Self Test (BiST) and calibration functionalities for current-mode based RFICs and demonstrates its application on the calibration of a current-driven passive mixer. A method is presented to extract test friendly DC features from the RF signal, without deteriorating the performance of test blocks in the transceiver. Simulation performance with IBM 90-nm process using 1.2 V power supply shows that the proposed detector is able to provide an RF to DC conversion gain of 35 mV/dB in a dynamic range of 25 dB from 900 MHz to 10 GHz. The current-mode detector is then applied in the IP2 digital calibration technique on the down-conversion mixer under several corner conditions. Simulation results confirm the feasibility of the calibration as IIP2 improves more than 20 dBm.
  • Keywords
    CMOS integrated circuits; built-in self test; calibration; current-mode circuits; integrated circuit testing; mixers (circuits); passive networks; radiofrequency integrated circuits; transceivers; BiST; CMOS RF/DC current-mode detector; IBM process; IIP2; IP2 digital calibration; RF signal; RF to DC conversion gain; built-in self test; calibration functionalities; current-driven passive mixer; current-mode based RFIC; down-conversion mixer; frequency 900 MHz to 10 GHz; power supply; simulation performance; size 90 nm; transceiver; voltage 1.2 V; CMOS integrated circuits; Calibration; Detectors; Mixers; Radio frequency; Transceivers; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-1261-5
  • Electronic_ISBN
    978-1-4673-1259-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2012.6463622
  • Filename
    6463622