• DocumentCode
    597019
  • Title

    Maximum delay variation temperature-aware standard cell design

  • Author

    Pons, Marc ; Nagel, J. ; Piguet, Christian

  • fYear
    2012
  • fDate
    9-12 Dec. 2012
  • Firstpage
    296
  • Lastpage
    299
  • Abstract
    Standard cell design suffers from temperature-induced delay uncertainty. In this paper we propose two methodologies to cope with this issue before the logic synthesis step without modifying the standard flow. Both methodologies are based on the study of the cell maximum delay sensitivity to temperature variations to select the cells of the library to be used for the synthesis. We provide icyflex2 CSEM processor synthesis to demonstrate the delay variability reduction obtained.
  • Keywords
    logic design; cell maximum delay sensitivity; delay variability reduction; icyflex2 CSEM processor synthesis; logic synthesis; maximum delay variation temperature-aware standard cell design; temperature variations; temperature-induced delay uncertainty; Delay; Equations; Libraries; Sensitivity; Standards; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on
  • Conference_Location
    Seville
  • Print_ISBN
    978-1-4673-1261-5
  • Electronic_ISBN
    978-1-4673-1259-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2012.6463743
  • Filename
    6463743