• DocumentCode
    598069
  • Title

    Local Line Derivative Pattern for face recognition

  • Author

    Zhichao Lian ; Meng Joo Er ; Yang Cong

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    Sept. 30 2012-Oct. 3 2012
  • Firstpage
    1449
  • Lastpage
    1452
  • Abstract
    In this paper, we propose a novel face descriptor for face recognition, named Local Line Derivative Pattern (LLDP). High-order derivative images in two directions are obtained by convolving original images with Sobel Masks. A revised binary coding function is proposed and three standards on arranging the weights are also proposed. Based on the standards, the weights of a line neighborhood in two directions are arranged. The LLDP labels in two directions are calculated with the proposed binary coding function and weights. The labeled image is divided into blocks where spatial histograms are extracted separately and concatenated into an entire histogram as features for recognition. The experiments on the FERET and Extended Yale B show superior performances of the proposed LLDP compared to other existing methods based on the LBP. The results prove that the LLDP has good robustness against expression, illumination and aging variations.
  • Keywords
    binary codes; face recognition; feature extraction; image coding; Extended Yale B database; FERET database; LLDP labels; Sobel masks; aging variation robustness; binary coding function; expression variation robustness; face descriptor; face recognition; high-order derivative images; illumination variation robustness; labeled image division; line neighborhood weights; local line derivative pattern; spatial histogram concatenation; spatial histogram extraction; Aging; Face; Face recognition; Histograms; Lighting; Robustness; Standards; Face recognition; High-order local pattern; Local binary pattern;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2012 19th IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4673-2534-9
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2012.6467143
  • Filename
    6467143